When a diffraction pattern of a crystalline solid is recorded using an X ray beam of wavelength 0 26 nm the first order

Question

When a diffraction pattern of a crystalline solid is recorded using an X ray beam of wavelength 0 26 nm the first order diffraction peak occurs at a scattering angle of 35 If the error in the measurements of angle and wavelength are 1 and 0 01 nm respectively then determine the error in measuring the interplanar spacing a 22 86 nm b 32 38 nm c 15 2 nm d 13 2 nm

Kunduz · Accepted Answer

Click to see the answer