2 3 Seven oxide thickness measurements of wafers are studied

Last updated: 10/3/2023

2 3 Seven oxide thickness measurements of wafers are studied to assess quality in a semiconductor manufacturing process The data in angstroms are 1264 1280 1301 1300 1292 1307 and 1275 Calculate the sample average and sam ple standard deviation Construct a dot diagram of the data wins 2 13 Calc Con 2 7